A device for measuring physical parameters

专利名称：A device for measuring physical parameters发明人：Stekelenburg, Jan Cornelis申请号：EP90201080.0申请日：19900427公开号：EP0395188A1公开日：19901031

专利附图：

摘要：A device for measuring physical parameters, in particular suitable for measuringtemperature, comprising a probe including a sensor element capable of converting thevalue to be measured into an electrical signal, said probe including a receiving circuit inwhich an AC voltage can be induced by an electromagnetic interrogation field which, in

operation, is generated by a transmitter/receiver forming part of the measuring device,which AC voltage can be modulated depending on the measured value of the physicalparameter, and wherein the probe includes a digital code circuit in which an identificationcode is stored, as well as a substantially digital measuring circuit connected to the sensorelement, the arrangement being such that, in operation, the code circuit and themeasuring circuit successively, through a switch element, modulate the AC voltageinduced in the receiver circuit with a binary signal.

申请人：N.V. Nederlandsche Apparatenfabriek NEDAP

地址：Oude Winterswijkseweg 7 NL-7141 DE Groenlo NL

国籍：NL

代理机构：Smulders, Theodorus A.H.J., Ir.

更多信息请下载全文后查看